Electron Microscope

Scanning Electron Microscope

SEM6200 Series

More info

Product description:
       ◇ Affordable
       ◇ English interface, with one key imaging function
       ◇ Automatic adjustment function: electron gun heating, bias, alignment, focus, brightness, contrast, dissipate degree, astigmatism and other memories
       ◇ Llow maintenance and repair costs


Project

SEM6200

SEM6000Z

 

Resolution

4.5nm (30KV)

 

Magnification;

15x~250,000x

 

Type electron gun

Hair Fork tungsten cathode

 

Acceleration voltage

0~30KV

 

Lens system

Three electromagnetic lens

 

Lens aperture

Three diaphragm can be selected to adjust the vacuum outside

 

Sample stage

Manual

X / Y automatic station

 

Stroke

X

0~50mm(big sample stage 0-80mm)

 

Y

0~50mm

 

Z

0~25mm(big sample stage 0-30mm)

 

R

360°

 

 

T

-5°~90°(big sample stage 0°-90°)

 

Detector

Secondary electron detector element, backscattered electron detector (optional), X-ray energy dispersive spectroscopy (optional)

 

Vacuum system

Molecular pump (diffusible molecular pump)

 

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