Product description:
SEM3200 series of scanning electron microscopy have been improved in the electrical control systems, computer systems, operation control software, image control, image processing software, automatic control, and many other aspects. The main characteristic is stable and reliable, compact, easy to operate, easy maintenance, is a high cost economy electron microscope.
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Project |
SEM3200 |
SEM3200Z |
SEM3200A |
SEM3200AZ |
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Resolution |
6.0nm (30KV) |
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15x-250,000x |
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Type electron gun |
Hair Fork tungsten cathode |
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Acceleration voltage |
0-30KV |
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Lens system |
Three electromagnetic lens |
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Lens aperture |
Three diaphragm can be selected to adjust the vacuum outside |
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Sample stage |
manual |
X / Y axis auto |
manual |
X / Y axis auto |
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Stroke |
X |
0-50mm (big sample stage 0?80mm) |
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Y |
0-50mm |
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Z |
0-25mm (big sample stage 0-30mm) |
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R |
360° |
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T |
-5°-90° (big sample stage 0°-90°) |
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Detector |
Secondary electron detector, backscattered electron detector (optional), X-ray energy dispersive spectroscopy (optional) |
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Vacuum system |
Diffusion pump |
Diffusion pump |
Molecular pump |
Molecular pump |
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